THE APPLICATION OF ATOMIC FORCE MICROSCOPE TO CLAY MINERALS
Received date: 1997-10-28
Revised date: 1997-12-29
Online published: 1998-08-01
There are many methods to study the surface component and structure of clay minerals, how ever these methods have different limitations. The atomic force microscope (AFM) is a recent innovation in instrumentation that provides topographic images, at the atomic scale resolution, of the surfaces of solid materials. It can image the hexagonal arrangement of basal O of the sheet of tetrahedra at molecular resolution and the OH plane of the sheet of octahedra at at omic resolution. It is becoming most important method to study the surface reaction, treatment and dissolve of clay minerals.
Key words： Clay minerals; AFM; Atomic resolution.
Wu Pingxiao，Zhang Huifen，Guo Jiugao . THE APPLICATION OF ATOMIC FORCE MICROSCOPE TO CLAY MINERALS[J]. Advances in Earth Science, 1998 , 13(4) : 351 -355 . DOI: 10.11867/j.issn.1001-8166.1998.04.0351
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