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Advances in Earth Science  2009, Vol. 24 Issue (7): 810-816    DOI: 10.11867/j.issn.1001-8166.2009.07.0810
Measurement and Analysis of Backscattering Properties on typical surface features
Xu Chunliang,Chen Yan,Jia Mingquan,Liu Zengcan,Lu Haiping,Tong Ling
University of Electronic Science and Technology of China, Chengdu 610054,China
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The backscattering coefficient on typical surface features such as, frozen soil, maize, etc. was measured by S and C bands FM-CW standard ground-based microwave scatterometer under the different time and different wave band and different polarized condition. The experiment and the measuring technique in detail are introduced. According to different scattering mechanisms, features are divided into two categories: Surface scattering and volume scattering. Scattering characteristics under the different time and different wave band and different polarized condition and the reasons for these differences are analyzed. Combining with the corresponding features scattering model, a quantitative study of a function between the backscattering coefficient and surface parameters is made. Different surface parameters of features by inversion are obtained. A variety of Influencing factors by comparing the measured dates.

Key words:  Ground-based scatterometer      Backscattering coefficient      Advanced Integral Equation Model(AI-EM)      Water-cloud model      Microwave remote sensing     
Received:  08 December 2008      Published:  10 July 2009
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XU Chun-Liang
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Xu Chunliang,Chen Yan,Jia Mingquan,Liu Zengcan,Lu Haiping,Tong Ling. Measurement and Analysis of Backscattering Properties on typical surface features. Advances in Earth Science, 2009, 24(7): 810-816.

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