收稿日期: 1997-10-28
修回日期: 1997-12-29
网络出版日期: 1998-08-01
基金资助
广东省自然科学基金资助项目(批准号:953204)。
THE APPLICATION OF ATOMIC FORCE MICROSCOPE TO CLAY MINERALS
Received date: 1997-10-28
Revised date: 1997-12-29
Online published: 1998-08-01
吴平霄，张惠芬，郭九皋 . 原子力显微镜在粘土矿物学研究中的应用[J]. 地球科学进展, 1998 , 13(4) : 351 -355 . DOI: 10.11867/j.issn.1001-8166.1998.04.0351
There are many methods to study the surface component and structure of clay minerals, how ever these methods have different limitations. The atomic force microscope (AFM) is a recent innovation in instrumentation that provides topographic images, at the atomic scale resolution, of the surfaces of solid materials. It can image the hexagonal arrangement of basal O of the sheet of tetrahedra at molecular resolution and the OH plane of the sheet of octahedra at at omic resolution. It is becoming most important method to study the surface reaction, treatment and dissolve of clay minerals.
Key words： Clay minerals; AFM; Atomic resolution.
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